By Dimitris Gizopoulos
This is a brand new form of edited quantity within the Frontiers in digital trying out booklet sequence dedicated to fresh advances in digital circuits checking out. The publication is a complete elaboration on very important themes which seize significant examine and improvement efforts at the present time. "Hot" subject matters of present curiosity to check know-how group were chosen, and the authors are key individuals within the corresponding topics.
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Extra resources for Advances in Electronic Testing: Challenges and Methodologies
In order to detect the fault, the transition must be propagated along the entire path (thus, the inverted transition through gate C must be blocked at G by setting E to 0). For the fault to be detected robustly, the existence of other delay faults in the circuit must not prevent detection. As an example of this, input F to gate H must be a fixed 0 value throughout the test – no hazards are allowed on F. A detailed discussion of delay fault models and testing is provided in a separate chapter of the book.
0 0/1 0 0/1 bridge 1 1/0 Figure 1-14: Byzantine generals behavior for bridging faults. Randomly-placed bridging defects are and will continue to be a serious problem in CMOS processes. As technology advances to smaller geometries, more metal layers, reduced design margin and higher frequencies, the effects of these defects will grow in complexity and the variety of bridging behavior that needs to be detected will increase. Nonetheless, it is and will remain impractical to develop complete models for bridging defects.
7% pseudo-stuck-at coverage 5232 transition tests with 91% transition coverage 22 Scan flush test (tests entire scan path for delays) Numerous significant results came from this experiment, and work from the data was reported as late as 2002 . It is instructive to look at the data in the same Venn diagram format as the HP data (see Figure 1-29).