Nanoscience: Friction and Rheology on the Nanometer Scale - download pdf or read online

By Ernst Meyer, K Dransfeld, Tibor Gyalog

Friction strength microscopy is a crucial analytical device within the box of tribology at the nanometer-scale. The touch zone among the probing tip and the pattern is diminished to a couple sq. nanometers, similar to definitely the right of a unmarried asperity touch. conventional innovations, reminiscent of friction coefficients, adhesion and elasticity and stick-slip are re-examined with this novel procedure. New strategies dependent upon classical and quantum mehanics are investigated.

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Extra info for Nanoscience: Friction and Rheology on the Nanometer Scale

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L. Euler, De Curvis elasticic, Acta Acad. Pretropolitanae (1778), L. Euler,Sur le frottement des corps solides, Me'm. Acad. Sci. Berl. 4, 122 (1748) L. Euler, Sur la diminuation de la rksistance du frottement, Me'm. Acad. Sci. Berl. 4, 133 (1748) L. Euler, Remarques sur l'effet du frottement dans l'equilibre, Me'm Acad. Sci. Berl. 18, 256 (1762) 5. C. A. Coulomb, Thkorie des machines simples, en ayant 6gard au frottement de leurs parties, et & la roideur des cordages, Me'm. Math. Phys. 161 Paris (1785) 6.

Different spheres, such as cobalt coated boro-silicate glass spheres, were used, which shows that SFA is not necessarily limited to coated mica sheets. The stiffness of the apparatus is high =1O6N/m. Both lateral and normal forces are measured with capacitive force sensors. In addition, the motion of the sphere relative to the plane is measured with a 3-axial capacitance sensor. The electrical capacitance of the sphere-plane system yields the distance between sphere and plane, also called “electrical” distance.

From4'. 9: Three-axial surface force apparatus (SFA) from the group of Georges in Lyon for measuring forces between a sphere and a plane. Three capacitance sensors control the relative motion of the sphere with an accuracy of 10-’nm. Normal and lateral forces are measured with 2 capacitive force sensors with a resolution of 10nN. The sample is mounted on a double-cantilever spring, which prevents unwanted rolling or shearing. The motion of the sample is achieved with a micrometer screw for coarse approach and piezoelectric crystals for small displacements in 3 orthogonal directions.

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